SEM / TEM Supplies

Low Magnification Calibration Standards

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Celestial Spheres
These spheres can be dispersed over any specimen being examined to provide a reference standard

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Silicon Test Specimen
This Test Specimen is made of a 5mmx5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm.

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High Resolution Gold on Carbon Test
For resolution test of SE and BSE imaging and also for chemical mapping in high-resolution systems such as an Auger scanning instrument.

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Very High Resolution Gold (<2nn - 30nm) on Carbon Test
For very high resolution performance testing of smaller gold particle size ranging from 2 nm to 30 nm.Ideal for testing at instrument magnifications of 50,000x and above.

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Ultra High Resolution Gold (<1 nm - 20 nm) on Carbon Test
With gold particles ranging from <1 nm to 20 nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source.

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Medium Resolution - Aluminium-Tungsten Dendrites
The various spacings created by the dendritic structure give the gap test, and the topographical arrangement of the dendrites leads to the gray level test,It is most useful for working in the probe size range of 25 to 75 nm.

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Tin On Carbon
Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic checking of your instrument performance

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X-Checker™
The X-Checkeris completed calibration ais for SEM/EDS Systems.
Each X-Checker comes with the following:
Manganese to measure full width at half max detector resoulation.
Aluminum and copper to perform spectral calibration.
Carbon to monitior calibration at the low end of the spectra for thin window dectectors. 
We are currently keeping stock of a few popular models of TEM grids in Singapore.  Please feel free to contact us for stock availability.